Materials Characterization
Atomic Force Microscopy Equipment
Atomic Force Microscope (AFM) | Bruker Dimension ICON AFM
Atomic Force Microscope (AFM) | Bruker Dimension ICON AFM
The Bruker Dimension Icon atomic force microscope (AFM)
Specifications
- Standard scanning probe microscope imaging techniques, including Bruker proprietary PeakForce Tapping, ScanAsyst, Tapping mode, contact mode, lateral force microscopy, lift mode, and piezo-response microscopy
- Icon XYZ closed-loop application module-ready SPM head
- 210 mm general purpose vacuum chuck
- PeakForce Tunneling AFM (TUNA) application Module
- PeakForce Quantitative nanoscale mechanical (QNM)
- PeakForce Kelvin probe force microscopy (KPFM): AM and PM detection
- Photoconductive AFM (pcAFM)
IMSE contact
Dr. Tyrone Daulton TDaulton@wustl.edu
Accessories
High efficiency direct drive tapping mode cantilever holder for scanning in fluid