Materials Characterization
X-ray Diffraction Equipment
X-ray Powder Diffraction (XRD) | Rigaku D-Max-B Powder Diffractometer
The Rigaku D-Max-B powder diffractometer
Specifications
- Cu K-alpha x-ray source
- 1.5 kV power supply
IMSE contact
Dr. Tyrone Daulton TDaulton@wustl.edu
X-ray Powder Diffraction (XRD) | Bruker DB8 Discover Plus
The D8 DISCOVER Plus is the most powerful and versatile X-ray diffractometer on the market. Its core is the high-accuracy ATLAS goniometer comprising the high-efficiency turbo X-ray source (TXS-HE) and the market-leading non-coplanar arm. It enables the structural characterization of a full range of materials, including powders, amorphous and polycrystalline, and multi-layered epitaxial thin films at ambient and non-ambient conditions.
Specifications
- Phase identification and quantification, structure determination and refinement, micro strain, and crystallite size analysis
- X-ray reflectometry, grazing incidence diffraction (GID), in-plane diffraction, high-resolution X-ray diffraction (XRD), GISAXS, GI-Stress analysis, crystal orientation analysis, residual stress analysis, texture and pole figures, micro X-ray diffraction, and wide angle X-ray scattering (WAXS)
- Total scattering analysis: Bragg diffraction, pair-distribution function (PDF), small angle X-ray scattering (SAXS)
IMSE contact
Dr. Tyrone Daulton TDaulton@wustl.edu
Accessories
Rigaku: Special attachment for limited high temperature operation