Materials Characterization
Scanning Electron Microscopy Equipment
Environmental Scanning Electron Microscope (ESEM) | ThermoFisher Quattro S ESEM
The ThermoFisher Quattro S environmental scanning electron microscope (ESEM)
Specifications
- Resolution: 0.7 nm@30 keV and 1.4 nm@1 keV
- Electron Source: High-stability Schottky field emission gun
- Operation voltage: 200 V to 30 kV
- Five coordinate (X, Y, Z, R and T) stage
- Detectors (imaging): Everhart-Thornley detector (ETD), lens-mounted directional backscatter electron (DBS) detector, low vacuum secondary electron (LVD) detector, and gaseous secondary electron detector (GSED)
- Variable pressure modes: High vacuum, low vacuum (10 Pa - 200Pa), and environmental (up to 4000 Pa)
- Beam deceleration with stage bias from -4000 V to +50V
- Oxford AzTec energy dispersive X-ray spectrometer (EDS)
- Oxford Symmetry electron backscattered detector (EBSD)
IMSE contact
Dr. Huafang Li Hli40@wustl.edu
Focused Ion Beam (FIB) | ThermoFisher Scios 2 DualBeam FIB
The ThermoFisher Scios 2 DualBeam focused ion beam (FIB)
Specifications
- Electron beam: high-stability Schottky field emission gun. Ultra-high resolution non-immersion field emission SEM column
- Electron beam operation voltage: 200 V to 30 kV
- Electron resolution: 0.7 nm@30 keV and 1.4 nm@1 keV
- Ion beam: Gallium liquid metal ion source (LMIS). Sidewinder ion column with excellent high-current performance
- Ion beam operation voltage: 500 V to 30 kV
- Ion resolution: 3.0 nm@30 kV using selective edge method
- Everhart-Thornley detector (ETD), retractable segmented solid-state backscatter electron detector (DBS), high performance ion conversion and electron (ICE) detector, T1 segmented lower in-lens detector, and T2 upper in-lens detector
- Platinum gas injection system (GIS)
- Thermo Scientific EasyLift Nanomanipulator system for in situ sample manipulation
- Variable pressure operation for electron beam imaging
IMSE contact
Dr. Huafang Li Hli40@wustl.edu
Accessories
Bruker PI88 Nanoindentor: In situ material mechanical properties measurement under an electron beam. It includes a standard transducer, high load transducer, and heating stage (up to 800 oC)
ThermoFisher Peltier cold stage: -20 oC to +55 oC
Cressington 108 manual sputter coater: Coating non-conducting samples with Au for SEM imaging
IMSE contact
Dr. Huafang Li Hli40@wustl.edu