Education

MEMS 5603 Materials Characterization Techniques I

An introduction to the basic theory and instrumentation used in transmission electron, scanning electron, and optical microscopy. Practical laboratory experience in equipment operations, experimental procedures, and material characterization. Fundamentals, applications, and hands-on laboratory experience in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and scanning electron microscopy (SEM). Topics include wave optics of electrons, electron lenses and aberrations, electron-specimen interactions, electron diffraction theory, and quantitative elemental analysis using X-ray energy dispersive spectroscopy (XEDS) and electron energy loss spectroscopy (EELS).

Credit: 3 units

Typical periods offered: Fall, Spring

MEMS 5604 Materials Characterization Techniques II

Introduction to crystallography and elements of X-ray physics. Diffraction theory and application to materials science including following topics: reciprocal lattice concept, crystal-structure analysis, Laue methods, rotating crystal methods, powder method, and laboratory methods of crystal analysis.

Credit: 3 units

Typical periods offered: Fall